HIGH RESOLUTION WAVEFRONT ANALYSIS
ONERA* patented technology
Phasics wavefront sensors all rely on an innovative patented technology: the quadriwave lateral shearing interferometry (QWLSI). It is based on a modified Hartmann mask to measure wavefront distortions.
ONERA* patented technology
Phasics wavefront sensors all rely on an innovative patented technology: the quadriwave lateral shearing interferometry (QWLSI). It is based on a modified Hartmann mask to measure wavefront distortions.